The Electron Microscopy Center offers access to multiple characterization and sample preparation techniques. A Scanning Electron Microscopes (SEM), a Transmission Electron Microscope (TEM), a dual beam (Focused Ion Beam/SEM), a small angle X-ray scattering (SAXS) system and a X-ray Photoelectron Spectroscopy (XPS) system are available at the EMC, in addition to specimen preparation stations (grinding/polishing, conductive coating deposition, dimpling, ion milling/polishing, etc…). For galleries corresponding to our different capabilities, please choose from the list below. Focused Ion Beam (FIB) Gallery View the FIB gallery Transmission Electron Microscopy (TEM) Image Gallery View the TEM gallery Scanning Electron Microscopy (SEM) Image gallery View the SEM photo gallery Energy Dispersive X-ray Spectroscopy (EDX) Image gallery View the EDX gallery X-ray Photoelectron Spectroscopy (XPS) Photo gallery View XPS photo gallery Sample Prep Image gallery View the sample prep gallery Micro Computerized Tomography (micro-CT) Image gallery View the Micro CT gallery Small-Angle X-ray Scattering (SAXS) Photo gallery View the SAXS gallery